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Design, automatisation et test en Europe : les documents les plus influents de 10 ans
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Numéro de l'objet eBay :386679789140
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Caractéristiques de l'objet
- État
- ISBN-13
- 9781402064876
- Book Title
- Design, Automation, and Test in Europe
- ISBN
- 9781402064876
- Subject Area
- Computers, Technology & Engineering
- Publication Name
- Design, Automation, and Test in Europe : the Most Influential Papers of 10 Years Date
- Publisher
- Springer Netherlands
- Item Length
- 9.3 in
- Subject
- Hardware / General, Electronics / Circuits / General, Electronics / General
- Publication Year
- 2008
- Type
- Textbook
- Format
- Hardcover
- Language
- English
- Item Height
- 0.4 in
- Item Weight
- 33.5 Oz
- Item Width
- 6.1 in
- Number of Pages
- Xii, 516 Pages
À propos de ce produit
Product Identifiers
Publisher
Springer Netherlands
ISBN-10
140206487X
ISBN-13
9781402064876
eBay Product ID (ePID)
25038575675
Product Key Features
Number of Pages
Xii, 516 Pages
Language
English
Publication Name
Design, Automation, and Test in Europe : the Most Influential Papers of 10 Years Date
Publication Year
2008
Subject
Hardware / General, Electronics / Circuits / General, Electronics / General
Type
Textbook
Subject Area
Computers, Technology & Engineering
Format
Hardcover
Dimensions
Item Height
0.4 in
Item Weight
33.5 Oz
Item Length
9.3 in
Item Width
6.1 in
Additional Product Features
Intended Audience
Scholarly & Professional
LCCN
2007-939398
Dewey Edition
22
Number of Volumes
1 vol.
Illustrated
Yes
Dewey Decimal
621.381
Table Of Content
System Level Design.- System Level Design: Past, Present, and Future.- Scheduling of Conditional Process Graphs for the Synthesis of Embedded Systems.- EXPRESSION: A Language for Architecture Exploration Through Compiler/Simulator Retargetability.- RTOS Modeling for System Level Design.- Context-Aware Performance Analysis for Efficient Embedded System Design.- Lock-Free Synchronization for Dynamic Embedded Real-Time Systems.- What If You Could Design Tomorrow's System Today?.- Networks on Chip.- Networks on Chips.- A Generic Architecture for On-Chip Packet-Switched Interconnections.- Trade-offs in the Design of a Router with Both Guaranteed and Best-Effort Services for Networks on Chip.- Exploiting the Routing Flexibility for Energy/Performance-Aware Mapping of Regular NoC Architectures.- xpipesCompiler: A Tool for Instantiating Application-Specific Networks on Chip.- A Network Traffic Generator Model for Fast Network-on-Chip Simulation.- Modeling, Simulation and Run-Time Management.- Modeling, Simulation and Run-Time Management.- Dynamic Power Management for Nonstationary Service Requests.- Quantitative Comparison of Power Management Algorithms.- Energy Efficiency of the IEEE 802.15.4 Standard in Dense Wireless Microsensor Networks: Modeling and Improvement Perspectives.- Statistical Blockade: A Novel Method for Very Fast Monte Carlo Simulation of Rare Circuit Events, and its Application.- Compositional Specification of Behavioral Semantics.- Design Technology for Advanced Digital Systems in CMOS and Beyond.- Design Technology for Advanced Digital Systems in CMOS and Beyond.- Address Bus Encoding Techniques for System-Level Power Optimization.- MOCSYN: Multiobjective Core-Based Single-Chip System Synthesis.- Minimum Energy Fixed-Priority Scheduling for VariableVoltage Processors.- Synthesis and Optimization of Threshold Logic Networks with Application to Nanotechnologies.- Physical Design and Validation.- Physical Design and Validation.- Interconnect Tuning Strategies for High-Performance ICs.- Efficient Inductance Extraction via Windowing.- Soft-Error Tolerance Analysis and Optimization of Nanometer Circuits.- A Single Photon Avalanche Diode Array Fabricated in Deep-Submicron CMOS Technology.- Test and Verification.- The Test and Verification Influential Papers in the 10 Years of DATE.- Cost Reduction and Evaluation of a Temporary Faults-Detecting Technique.- An Integrated System-on-Chip Test Framework.- Efficient Spectral Techniques for Sequential ATPG.- BerkMin: A Fast and Robust Sat-Solver.- Improving Compression Ratio, Area Overhead, and Test Application Time for System-on-Chip Test Data Compression/Decompression.- An Effective Technique for Minimizing the Cost of Processor Software-Based Diagnosis in SoCs.
Synopsis
The Design Automation and Test in Europe, DATE, is Europe's leading international electronic systems design conference for electronic design, automation and test, from system level hardware and software implementation right down to integrated circuit design. It combines the conference with Europe's leading international ex- bition for electronic design, automation and test. To celebrate the tenth anniversary of DATE, we have compiled this book with the aim to highlight some of the most influential technical contributions from ten years of DATE. Selecting 30 papers, only 3 papers from each year, is a challenging endeavor. Although the impact of papers from the first years of DATE can be det- mined through various citation indexes, the impact from the later years still have to be seen. Together with all 10 Program Chairs, we have made a selection of the most influential papers covering the very broad range of topics which is characteristic for DATE., The Design, Automation and Test in Europe (DATE) conference celebrated in 2007 its tenth anniversary. As a tribute to the chip and system-level design and design technology community, this book presents a compilation of the three most influential papers of each year. This provides an excellent historical overview of the evolution of a domain that contributed substantially to the growth and competitiveness of the circuit electronics and systems industry. The papers were grouped in six sections: System Level Design; Networks on Chip; Modeling, Simulation and Run-Time Management; Digital Systems in CMOS and Beyond; Physical Design and Validation; and Test and Verification. The winners of the prestigious EDAA Lifetime Achievement Award as well as other recognized experts in their field wrote an introduction to each section, summarizing the history in their domain and indicating how the selected DATE papers contributed to it.
LC Classification Number
TK7867-7867.5
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