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Advances in X-Ray Analysis : Proceedings of the, Newkirk, Mallett, Pfeiffer-,
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Numéro de l'objet eBay :335221339521
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Caractéristiques de l'objet
- État
- PublishedOn
- 2013-10-10
- Title
- Advances in X-Ray Analysis: Proceedings of the Sixteenth Annual
- ISBN
- 9781468486780
- Subject Area
- Science
- Publication Name
- Advances in X-Ray Analysis : Proceedings of the Sixteenth Annual Conference on Applications of X-Ray Analysis Held August 9-11, 1967 Volume 11
- Publisher
- Springer
- Item Length
- 10 in
- Subject
- Spectroscopy & Spectrum Analysis, Physics / Optics & Light, Chemistry / Physical & Theoretical
- Publication Year
- 2013
- Type
- Textbook
- Format
- Trade Paperback
- Language
- English
- Item Weight
- 34.3 Oz
- Item Width
- 7 in
- Number of Pages
- Xi, 499 Pages
À propos de ce produit
Product Information
X-ray emission spectrography, while based on Moseley's work, as a generally useful analytical method had its genesis in the work of Friedman, Birks, and Brooks 30 years ago. The central theme of this conference, quantitative methods in X-ray spectrometric analy sis, and the large number of papers on that subject attest to the growth of the application and usefulness of X-ray emission. It is a privilege to have as an invited speaker Laverne Birks, one of the original group that put X-ray emission into analytical chemistry. Determination of elements above titanium in the periodic table was considered the province of X-ray fluorescence, and most of the early development was aimed at the analy sis of alloys. The papers in this volume on metals analysis accept most operational features as routine and have concentrated on the improved treatment of the observed data in order to convert them to more accurate results. As the treatment of matrix effects, geometry, and stability have been better understood, corrections have become routine. For most elements that are present in amounts greater than a few parts per million, determinations can now be done with accuracies rivaling wet methods. Trace quantities are being determined to lower and lower amounts, largely owing to improvement of equipment and development of concentration techniques. For most trace elements, X-ray spectrography has become the preferred analytical method. The develop ment of improved methods for separating signals from noise should lead to major reduc tions in minimum detection levels.
Product Identifiers
Publisher
Springer
ISBN-10
1468486780
ISBN-13
9781468486780
eBay Product ID (ePID)
203398037
Product Key Features
Number of Pages
Xi, 499 Pages
Language
English
Publication Name
Advances in X-Ray Analysis : Proceedings of the Sixteenth Annual Conference on Applications of X-Ray Analysis Held August 9-11, 1967 Volume 11
Publication Year
2013
Subject
Spectroscopy & Spectrum Analysis, Physics / Optics & Light, Chemistry / Physical & Theoretical
Type
Textbook
Subject Area
Science
Format
Trade Paperback
Dimensions
Item Weight
34.3 Oz
Item Length
10 in
Item Width
7 in
Additional Product Features
Intended Audience
Scholarly & Professional
Number of Volumes
1 Vol.
Illustrated
Yes
Lc Classification Number
Qd450-882
Table of Content
Recent Advances in Quantitative X-Ray Spectrometric Analysis by Solution Techniques.- X-Ray Fluorescence Spectroscopy in the Analysis of Ores, Minerals, and Waters.- Common Sources of Error in Electron Probe Microanalysis.- X-Ray Spectrographic Analysis of Traces in Metals by Preconcentration Techniques.- Theoretical Correction for Coexistent Elements in Fluorescent X-Ray Analysis of Alloy Steel.- Micro Fluorescent X-Ray Analyzer.- Use of Primary Filters in X-Ray Spectrography: A New Method for Trace Analysis.- Precision and Accuracy of Silicate Analyses by X-Ray Fluorescence.- Applications of Computerized Statistical Techniques in Quantitative X-Ray Analysis.- X-Ray Fluorescence Analysis of a Manganese Ore.- Total Nondestructive Analysis of CAAS Syenite.- X-Ray Fluorescence of Suspended Particles in a Liquid Hydrocarbon.- The Effect of Surface Roughness in Polymers on X-Ray Fluorescence Intensity Measurements.- Production Control of Gold and Rhodium Plating Thickness on Very Small Samples by X-Ray Spectroscopy.- A Study of X-Ray Fluorescence Method with Vacuum and Air-Path Spectrographs for the Determination of Film Thicknesses of II-VI Compounds.- Rare-Earth Analyses by X-Ray-Excited Optical Fluorescence.- Nondispersive X-Ray Fluorescent Spectrometer.- The Influence of Sample Self-Absorption on Wavelength Shifts and Shape Changes in the Soft X-Ray Region: The Rare-Earth M Series.- The X-Ray Wavelength Scale in the Long-Wavelength Region.- Applications of a Portable Radioisotope X-Ray Fluorescence Spectrometer to Analysis of Minerals and Alloys.- The Application of Radioisotope Nondispersive X-Ray Spectrometry to the Analysis of Molybdenum.- Quantitative Microprobe Analysis of Thin Insulating Films.- The Effect of Microsegregation on the Observed Intensity in Thin-FilmMicroanalysis.- Multistep Intensity Indication in Scanning Microanalysis.- Investigation and Demonstration of Single-Crystal and Powder Diffraction by Using Zero-Power Beta-Excited X-Ray and 55Fe Isotopic Sources.- An X-Ray Small-Angle Scattering Instrument.- Study of Extended X-Ray Absorption Fine Structure with the Use of Thick Targets.- Determination of Lattice Parameters by the Kossel and Divergent X-Ray Beam Techniques.- Fully Automated High-Precision X-Ray Diffraction.- Computerized Multiphase X-Ray Powder-Diffraction Identification System.- Measurement of Elastic Strains in Crystal Surfaces by X-Ray Diffraction Topography.- X-Ray Double-Crystal Method of Analyzing Microstrains with BeO Single Crystals.- X-Ray Stress Measurement by the Single-Exposure Technique.- Residual Stress and Shape Distortion in High-Strength Tool Steels.- Irradiation Effects in Some Crystalline Ceramics.- An X-Ray Diffraction Study of the Aging Reaction in Two Austenitic Alloys.- A Simplified Method of Quantitating Preferred Orientation.- Crystallite Orientation Analysis for Rolled Cubic Materials.- Topotactical Relationships Between Hematite ?-Fe2O3 and the Magnetite Fe3O4 Which is Formed on It by Thermal Decomposition under Low Oxygen Pressure.- Crystal Structure Analysis of Niobium-Doped Rutile Single Crystal.- Author Index.
Copyright Date
1968
Description de l'objet fournie par le vendeur
Informations sur le vendeur professionnel
WRAP Ltd
Mubin Ahmed
2 Lester Way
Wallingford
OX10 9TA
United Kingdom
Numéro de TVA :
- GB 724498118
Numéro d'immatriculation de la société :
- 03800600
Je certifie que toutes mes activités de vente seront conformes à toutes les lois et réglementations de l'UE.
Numéro CRN :
- 03800600
Le vendeur assume l'entière responsabilité de cette annonce.
Numéro de l'objet eBay :335221339521
Dernière mise à jour le 08 mai 2024 17:13:22 CEST. Afficher toutes les modificationsAfficher toutes les modifications
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